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The X and Z series of SciAps can be used to detect low concentration silicon (Si) content in silicon-carbon steel.

Source: Time:2019-04-01 10:33:25 views:

Nowadays, SciAps X-series (XRF) and Z-series (LIBS) hand-held analyzers are widely used to detect the low concentration of silicon (Si) in silicon-carbon steel.
Nowadays, SciAps X-series (XRF) and Z-series (LIBS) hand-held analyzers are widely used to detect the low concentration of silicon (Si) in silicon-carbon steel.
Both methods can detect 0.05% silicon (Si) in 3 or 5 seconds. Z Series is the first and only recognized LIBS device for PMI testing in the world.

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